首页>
外国专利>
Highly sensitive emitter for strontium isotope analysis of picogram-level samples by thermal ionization mass spectrometry
Highly sensitive emitter for strontium isotope analysis of picogram-level samples by thermal ionization mass spectrometry
展开▼
机译:通过热电离质谱分析皮克级样品中锶同位素的高灵敏度发射极
展开▼
页面导航
摘要
著录项
相似文献
摘要
A method for strontium isotope analysis of picogram-level samples using highly sensitive silicotungstic acid emitter is presented by a thermal ionization mass spectrometry. The emitter has merits of extremely high sensitivity, low cost, simple operation, etc. It is an important innovation of the strontium isotope analysis of the picogram-level samples. Compared with a sample consumption of 1-50 ng of conventional emitter, the present invention only needs 30-200 pg to obtain satisfying measurement accuracy. The present invention greatly improves test sensitivity, and has broad application prospects in future.
展开▼