首页> 外国专利> SCREENING APPARATUS FOR A LAB-ON-A-CHIP ANALYSER, LAB-ON-A-CHIP ANALYSER, AND METHOD FOR OPERATING A LAB-ON-A-CHIP ANALYSER

SCREENING APPARATUS FOR A LAB-ON-A-CHIP ANALYSER, LAB-ON-A-CHIP ANALYSER, AND METHOD FOR OPERATING A LAB-ON-A-CHIP ANALYSER

机译:用于基于芯片的实验室分析仪的筛选设备,基于芯片的实验室分析仪以及用于操作基于芯片的分析仪的方法

摘要

The invention relates to a screening apparatus (105) for screening a light path (107) between an optical unit (110) of a lab-on-a-chip-analyser (100) and a lab-on-a-chip cartridge (115) for a lab-on-a-chip analyser (100). The screening apparatus (105) comprises a hollow body (130) and a contact (135). The hollow body (130) has an optical opening (140) for connecting the hollow body (130) to the optical unit (110) and a cartridge opening (145) for connecting the hollow body (130) to the lab-on-a-chip cartridge (115). Additionally, the hollow body (130) is designed to shape the light path (107) between the optical opening (140) and the cartridge opening (145) and to screen it against ambient light. The contact element (135) is arranged on the hollow body (130) for establishing electrical contact with the lab-on-a-chip cartridge (115).
机译:本发明涉及一种用于对芯片实验室分析仪(100)的光学单元(110)和芯片实验室套筒(110)之间的光路(107)进行遮光的检查装置(105)。 115)用于芯片实验室分析仪(100)。筛选设备(105)包括空心体(130)和接触件(135)。中空体(130)具有用于将中空体(130)连接至光学单元(110)的光学开口(140)和用于将中空体(130)连接至实验室的盒(145)的盒口(145)。芯片盒(115)。另外,中空体(130)被设计成使光学开口(140)和盒开口(145)之间的光路(107)成形并使其免受环境光的影响。接触元件(135)布置在空心体(130)上,用于与芯片实验室盒(115)建立电接触。

著录项

  • 公开/公告号WO2020083765A1

    专利类型

  • 公开/公告日2020-04-30

    原文格式PDF

  • 申请/专利权人 ROBERT BOSCH GMBH;

    申请/专利号WO2019EP78339

  • 发明设计人 SEIDL KARSTEN;FRANK TINO;

    申请日2019-10-18

  • 分类号B01L9;F21V8;B01L3;

  • 国家 WO

  • 入库时间 2022-08-21 11:11:40

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