ELEMENTAL ANALYSIS DEVICE, PROGRAM FOR ELEMENTAL ANALYSIS DEVICE, AND ELEMENTAL ANALYSIS METHOD

摘要

An elemental analysis device 100 analyzes gas produced through the heating of a sample accommodated in a graphite crucible and is capable of enhancing analysis accuracy through baseline correction using a baseline that simulates signal intensity change over time caused by gas produced from the graphite crucible. The elemental analysis device 100 comprises a signal intensity reception unit 11 for receiving a signal intensity obtained by a gas detector and a baseline correction unit 12 for subjecting a spectrum S indicating the change over time in the signal intensity to baseline correction using a correction function having, as parameters, a starting point intensity that is the signal intensity at a rising start point A of a peak of the spectrum S and an ending point intensity that is the signal intensity at a falling end point B of the peak. The correction function is made to converge at the starting point intensity and ending point intensity and have a part X between the rising start point A and falling end point B that has a slope different from the slope of a straight line Z joining the rising start point A and falling end point B.