STRESS PROPERTIES MEASUREMENT METHOD, STRESS PROPERTIES MEASUREMENT DEVICE, AND STRESS PROPERTIES MEASUREMENT SYSTEM

摘要

This stress properties measurement method measures the properties of stresses generated in a structure and comprises: a step for acquiring, from a first imaging device, a plurality of thermal images in accordance with the surface temperature of the structure and having imaging times differing from one another; a step for generating stress distribution images corresponding to each of the plurality of thermal images; a step for acquiring, in each of the stress distribution images, a stress value of a first section in which a stress gradient is less than a prescribed value and respective stress values of a plurality of second sections in which stress is concentrated; and a step for using the stress value of the first section and the respective stress values of the plurality of second sections to derive the correlation properties of stresses in the sections of the structure.