首页> 外国专利> System and Merhod for Log Euclidean Metric Learning using Riemannian Submanifold Framework on Symmetric Positive Definite Manifolds

System and Merhod for Log Euclidean Metric Learning using Riemannian Submanifold Framework on Symmetric Positive Definite Manifolds

机译:使用对称正定流形上的黎曼子流形框架进行对数欧氏度量学习的系统和方法

摘要

The present invention removes nonlinear constraints by performing a linear transformation on a normal coordinate of a positive definite matrix (SPD matrix) to improve speed and accuracy during training. A log Euclidean metric learning apparatus and method using a sub-manifold framework, comprising: a tangent space mapping unit that maps data represented by a symmetric positive definite (SPD) matrix to a tangent space; A Euclidean point processing unit representing the points mapped in the unit as Euclidean points (R D ); a subspace mapping unit mapping to subspaces (R K ) through the parameter W; By re-mapping from Tangent space to SPD(n) through Expm(matrix exponential), the points of the same class are reduced by using the objective function, while the points of other classes are distanced. It includes a; re-mapping unit to increase the metric learning.
机译:本发明通过对正定矩阵(SPD矩阵)的法线坐标执行线性变换来消除非线性约束,以提高训练期间的速度和准确性。一种使用子流形框架的对数欧氏度量学习设备和方法,包括:切线空间映射单元,将由对称正定(SPD)矩阵表示的数据映射到切线空间;欧氏点处理单元,将在该单元中映射的点表示为欧氏点(R D );通过参数W映射到子空间(R K )的子空间映射单元;通过通过Expm(矩阵指数)从切线空间重新映射到SPD(n),可以使用目标函数来减少同一类别的点,而其他类别的点则要相距较远。它包括一个;重新映射单元以增加度量学习。

著录项

  • 公开/公告号KR20200093970A

    专利类型

  • 公开/公告日2020-08-06

    原文格式PDF

  • 申请/专利权人 중앙대학교 산학협력단;

    申请/专利号KR20190011369

  • 发明设计人 권준석;박성우;

    申请日2019-01-29

  • 分类号G06N20;G06K9/62;

  • 国家 KR

  • 入库时间 2022-08-21 11:06:15

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