METHOD OF ANALYZING SILICON REDUCER USING FOURIER TRANSFORM INFRARED SPECTROSCOPY

摘要

The present invention relates to a method for analyzing a silicon reducing agent using an infrared spectrometer. In one embodiment, a method of preparing a sample of a silicon reducing agent, measuring an infrared spectral spectrum of a sample, and integrating a region of 1100 cm ^-1 to 1020 cm ^{-1 in} the spectral spectrum to derive a measurement value And a method for analyzing a silicon reducing agent using an infrared spectrometer, comprising calculating a concentration value of silicon oxide using a calibration curve for a measured value and a standard sample.