Provided is a CZT semiconductor activity meter (100) and an activity measuring device (200), which relate to the field of medical apparatus and instruments. The CZT semiconductor activity meter (100) comprises a shell (110), a CZT probe (130), a package substrate (150) and a processing module (170), wherein the CZT probe (130) is arranged on an end of the shell (110), the package substrate (150) is arranged at the middle part of the shell (110) and abuts against an inner wall of the shell (110), the CZT probe (130) is connected to one side of the package substrate (150), the other side of the package substrate (150) and the inner wall of the shell (110) together form a package inner cavity, and the processing module (170) is accommodated in the package inner cavity and connected to the package substrate (150). The CZT semiconductor activity meter (100) has a small volume, is convenient to operate, does not require manual control during detection, and can be used at room temperature.
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