CARTE SONDE DE PLAQUETTE, APPAREIL D'ANALYSE COMPRENANT LADITE CARTE ET PROCÉDÉ DE FABRICATION DE LA CARTE SONDE DE PLAQUETTE

摘要

Provided are a wafer probe card which can match in one-to-one correspondence with an LED wafer by implementing a probe system having the same size as the LED wafer, and can inspect the brightness and a wavelength of light emitted from a plurality of LEDs at once by controlling the plurality of LEDs to emit light, an analysis apparatus having the same, and a method for fabricating the wafer probe card.