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Uncertainty estimation in complex permittivity measurements by shielded dielectric resonator technique using the Monte Carlo method

机译:采用蒙特卡罗方法的屏蔽介质谐振器技术测量复介电常数的不确定度

摘要

In this paper, we estimate the uncertainty in complex permittivity measurements performed in a shielded dielectric resonator, by using the Monte Carlo Method. We selected this approach since the theoretical expressions required to interpret the experimental results are highly non-linear. Furthermore the resonant frequency of the system and its quality factor are highly correlated. Thus we propose audmodel for the measurement process which considers the major sources of uncertainty previously reported in published experimental results.udThe proposed model combined with the Monte Carlo method was used to propagate the probability distributions of each uncertainty contribution, obtaining a) the approximate probability density function for the measured complex permittivity, and b) the estimated expanded uncertainty for the mode TE011. The results show that this procedure leads to small uncertainty intervals for the real part of the dielectric permittivity, while it is not very reliable in the loss tangent measurement.udAdditionally, for each input quantity, we calculated the standard deviation in the experimental results produced independently by each uncertainty contribution.
机译:在本文中,我们通过使用蒙特卡洛方法来估计在屏蔽介电谐振器中执行的复介电常数测量中的不确定性。我们选择这种方法是因为解释实验结果所需的理论表达式是高度非线性的。此外,系统的谐振频率及其质量因数高度相关。因此,我们提出了一个用于测量过程的ud模型,该模型考虑了以前在已发表的实验结果中报告的不确定性的主要来源。 ud将该模型与蒙特卡洛方法相结合,用于传播每个不确定性贡献的概率分布,从而获得a)测得的复介电常数的近似概率密度函数,以及b)TE011模式的估计扩展不确定性。结果表明,该程序导致介电常数的实部的不确定性间隔较小,而在损耗角正切测量中并不是很可靠。 ud此外,对于每个输入量,我们在产生的实验结果中计算标准偏差由每个不确定性贡献独立。

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