Enhancement and evaluation of SCIRTSS (sequential circuits test search system) on ISCAS'89 benchmark sequential circuits

摘要

SCIRTSS, the automatic test pattern generation system for sequential circuit described in AHPL, has been improved to have the best and correct version of the D-Algorithm. This improvement works together with the recent enhancement of the backward state justification search. SCIRTSS now has a complete set of procedures to generate tests for sequential circuits. The performance of SCIRTSS is evaluated using the recent ISCAS'89 sequential benchmark circuits. The overall concepts of how SCIRTSS generate tests, the improvements made on the D-Algorithm, and the benchmark results are presented in this thesis.