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Treatment of Cu-CMP Waste Streams Containing Copper(II) using Polyethyleneimine (PEI)

机译:聚乙烯亚胺(PEI)处理含铜(II)的Cu-CMP废液

摘要

The semiconductor industry has been growing at a fast pace in the last several decades and this growth is expected to continue in the future. One process that is repeated several times in a microchip fabrication is the Chemical Mechanical Planarization (CMP). CMP is a critical process that must be employed after the metal deposition step to eliminate any topography over which the next layer must be processed. Today, copper interconnect is widely used. In addition to possess a high resistance to electro migration effects and low electrical resistivity, copper techniques require fewer (approximately 25%) processing steps. CMP and post-CMP cleaning processes are projected to account for 50 percent of the water consumed by fabrication's ultra pure water. While there are a variety of treatment schemes currently available for the removal of heavy metals from CMP wastewater streams, many introduce additional chemicals to the process, have large space requirement, or are not effective. Polyethyleneimine (PEI) is well known to use in the ion metal affinity chromatography (IMAC) due to the great metal ion binding abilities. While work has been conducted on the use of PEI on membrane filtration for binding metals from industrial wastewaters, the experiments performed in this research are novel with respect to the waste (Cu CMP) treated as well as the method of packed bed column treatment. This research focused primarily on the study of an alternative technique to remove both metal ions and metal-chelated complexes from Cu CMP wastewater streams. Not only copper, wastewater often contains chelating agents, surfactant, organic compounds, and inhibitors. Thus, most of the time copper ions form complexes with chelating agents, which made typical ion exchange resins ineffective. The work, then, explored the effect of components typically found in Cu CMP waste streams on the binding of copper ions to PEI. The competitive binding of copper between PEI and other complexing agents were also investigated. A secondary focus of this study was to fully develop and characterize the column performance and behavior. This includes the understanding of the chemistry of CMP waste characterization. This treatment technique using a PEI packed bed column showed great copper binding capacity. The column is capable of removing Cu CMP waste streams, which contain both copper ions and copper complexes, due to the unique ability of PEI that can play both cation and anion exchanger roles. This waste treatment technique is feasible for the semiconductor industry as large volumes of copper contaminated solutions from actual waste can be concentrated twelve-fold for metal recovery using hydrochloric acid. The adsorbent can be regenerated more than hundred of times with changing in the performance and the reproducibility.
机译:在过去的几十年中,半导体行业一直在快速增长,并且这种增长有望在未来继续下去。在微芯片制造中重复多次的一种过程是化学机械平坦化(CMP)。 CMP是关键的过程,必须在金属沉积步骤之后采用CMP,以消除必须在其上处理下一层的任何形貌。如今,铜互连已被广泛使用。除了具有对电迁移效应的高抵抗力和低电阻率之外,铜技术还需要更少的工艺步骤(大约25%)。 CMP和CMP后清洗工艺预计将占制造厂超纯水消耗水的50%。尽管目前有多种处理方案可用于从CMP废水流中去除重金属,但许多方案会向该过程中引入其他化学物质,空间需求大或无效。众所周知,聚乙烯亚胺(PEI)由于具有强大的金属离子结合能力,可用于离子金属亲和色谱(IMAC)。尽管已经开展了将PEI用于膜过滤以结合工业废水中的金属的工作,但该研究在处理废料(Cu CMP)以及填充床柱处理方法方面是新颖的。这项研究主要侧重于一种替代技术的研究,该技术可从Cu CMP废水流中去除金属离子和金属螯合的络合物。不仅铜,废水还经常包含螯合剂,表面活性剂,有机化合物和抑制剂。因此,大多数时候铜离子与螯合剂形成络合物,这使典型的离子交换树脂失效。然后,这项工作探讨了通常在Cu CMP废料流中发现的组分对铜离子与PEI结合的影响。还研究了PEI和其他络合剂之间铜的竞争结合。这项研究的次要重点是充分开发和表征色谱柱的性能和行为。这包括对CMP废料表征化学的了解。使用PEI填充床色谱柱的这种处理技术显示出强大的铜结合能力。由于PEI既具有阳离子作用,又具有阴离子交换作用,因此该色谱柱能够去除含有铜离子和铜络合物的Cu CMP废液。这种废物处理技术对于半导体行业是可行的,因为可以将实际废物中的大量铜污染溶液浓缩十二倍,以便使用盐酸进行金属回收。随着性能和可重复性的改变,吸附剂可以再生一百多次。

著录项

  • 作者

    Maketon Worawan;

  • 作者单位
  • 年度 2007
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  • 原文格式 PDF
  • 正文语种 EN
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