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Changes in Surface Roughness and Work Function of Indium-tin-oxide Due to KrF Excimer Laser Irradiation

机译:KrF受激准分子激光辐照引起的氧化铟锡表面粗糙度和功函数的变化

摘要

[[abstract]]In this study, from the observed x-ray photoelectron spectroscopy and atomic force microscopy results, and Kelvin probe measurements, it is suggested that the induced indium-tin-oxide (ITO) surface chemical changes by KrF excimer laser irradiation had strong effects on the surface work function (SWF) and surface roughness of ITO. During the laser irradiation, the incorporation of O22− peroxo species or the dissolution of oxygen species near the ITO surface leads to the reduction of the surface roughness and an increase in the SWF. In addition, it is worth noting that the laser-irradiated ITO sample has an excellent stability in the SWF.
机译:[[摘要]]在这项研究中,从观察到的X射线光电子能谱和原子力显微镜检查结果以及开尔文探针测量结果,我们认为KrF受激准分子激光辐照引起的氧化铟锡(ITO)表面化学变化对ITO的表面功函数(SWF)和表面粗糙度有很大影响。在激光辐照期间,O22-过氧物质的掺入或氧物质在ITO表面附近的溶解导致表面粗糙度的降低和SWF的增加。另外,值得注意的是,激光照射的ITO样品在SWF中具有出色的稳定性。

著录项

  • 作者

    Lin Yow-Jon;

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  • 年度 2013
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  • 原文格式 PDF
  • 正文语种 en
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