首页> 外文OA文献 >The half-widths of Bragg intensity profiles measured with a triple-crystal diffractometer at a synchrotron-radiation source. II. The half-widths of YIG and Si single crystals
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The half-widths of Bragg intensity profiles measured with a triple-crystal diffractometer at a synchrotron-radiation source. II. The half-widths of YIG and Si single crystals

机译:用三晶体衍射仪在同步辐射源上测得的布拉格强度分布的半峰宽。二。 YIG和Si单晶的半峰宽

摘要

The practical usefulness of the expressions for the half-width proposed in paper I [Rossmanith (1993). J. Appl. Cryst. 26, 753-755] are demonstrated for three examples: a spherical YIG (yttrium iron garnet) crystal, a spherical silicon crystal and a plane-parallel perfect silicon plate. The new concept for the calculation of the width results in theoretical widths that are in excellent agreement with experimental widths observed in parallel and antiparallel arrangements of the sample with respect to the second monochromator crystal.
机译:论文I [Rossmanith(1993)提出的半角表达式的实用性。 J.应用水晶[图26,753-755]针对三个示例进行了说明:球形YIG(钇铁石榴石)晶体,球形硅晶体和平行于平面的完美硅板。用于计算宽度的新概念导致理论宽度与样品相对于第二单色仪晶体的平行和反平行排列中观察到的实验宽度极好一致。

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