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Magnetic field dependence of the internal quality factor and noise performance of lumped-element kinetic inductance detectors

机译:内部质量因数与磁场的关系以及集总动电感检测器的噪声性能

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摘要

We present a technique for increasing the internal quality factor of kinetic inductance detectors (KIDs) by nulling ambient magnetic fields with a properly applied magnetic field. The KIDs used in this study are made from thin-film aluminum, they are mounted inside a light-tight package made from bulk aluminum, and they are operated near 150 mK. Since the thin-film aluminum has a slightly elevated critical temperature (T_c = 1.4 K), it therefore transitions before the package (T_c = 1.2 K), which also serves as a magnetic shield. On cooldown, ambient magnetic fields as small as approximately 30 µT can produce vortices in the thin-film aluminum as it transitions because the bulk aluminum package has not yet transitioned and therefore is not yet shielding. These vortices become trapped inside the aluminum package below 1.2 K and ultimately produce low internal quality factors in the thin-film superconducting resonators. We show that by controlling the strength of the magnetic field present when the thin film transitions, we can control the internal quality factor of the resonators. We also compare the noise performance with and without vortices present, and find no evidence for excess noise beyond the increase in amplifier noise, which is expected with increasing loss.
机译:我们提出了一种通过适当地施加磁场来消除环境磁场来提高动感检测器(KID)内部质量因数的技术。本研究中使用的KID由薄膜铝制成,它们安装在由散装铝制成的不透光包装中,并且在150 mK附近工作。由于薄膜铝的临界温度略高(T_c​​ = 1.4 K),因此它在封装(T_c = 1.2 K)之前转变,该封装也用作磁屏蔽。冷却时,由于散装的铝包装尚未转变,因此尚未屏蔽,因此大约30µT的环境磁场会在薄膜铝转变时产生涡流。这些涡流被困在低于1.2 K的铝封装内部,并最终在薄膜超导谐振器中产生较低的内部品质因数。我们表明,通过控制薄膜过渡时存在的磁场强度,我们可以控制谐振器的内部品质因数。我们还比较了存在和不存在涡流的情况下的噪声性能,并且没有发现超出放大器噪声增加的多余噪声的证据,这是随着损耗增加而预期的。

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