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Universal Testing Apparatus Implementing Various Repetitive Mechanical Deformations to Evaluate the Reliability of Flexible Electronic Devices

机译:通用测试设备实现各种重复机械变形以评估柔性电子设备的可靠性

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摘要

A requirement of flexible electronic devices is that they maintain their electrical performance during and after repetitive mechanical deformation. Accordingly, in this study, a universal test apparatus is developed for in-situ electrical conductivity measurements for flexible electrodes that are capable of applying various mechanical deformations such as bending, twisting, shearing, sliding, stretching, and complex modes consisting of two simultaneous deformations. A novel method of deforming the specimen in an arc to induce uniform bending stress in single and alternating directions is also proposed with a mathematically derived control method. As an example of the arc bending method, the changes in the resistance of the printed radio frequency identification (RFID) tag antennas were measured by applying repetitive inner bending, outer bending, and alternating inner-outer bending. After 5000 cycles, the increases in resistance of the specimens that were subjected to inner or outer bending only were under 30%; however, specimens that were subjected to alternating inner-outer bending showed an increase of 135% in resistance. It is critical that the reliability of flexible electronic devices under various mechanical deformations be determined before they can be commercialized. The proposed testing apparatus can readily provide various deformations that will be useful to inform the design of device shapes and structures to accommodate deformations during use.
机译:灵活电子设备的要求是它们在重复机械变形期间和之后保持其电气性能。因此,在本研究中,为能够施加各种机械变形的柔性电极开发通用测试装置,该柔性电导率是由两个同时变形组成的弯曲,扭曲,剪切,滑动,拉伸和复杂模式的柔性电导率。 。还提出了一种用数学导出的控制方法提出以单个和交替方向诱导单个和交替方向均匀弯曲应力的新方法。作为电弧弯曲方法的示例,通过施加重复的内弯曲,外部弯曲和交替的内外弯曲来测量印刷射频识别(RFID)标签天线的电阻的变化。 5000次循环后,对内部或外部弯曲的标本的阻力增加仅为30%;然而,对交替的内外弯曲进行的标本显示抗性的135%。重要的是,在可以商业化之前确定在各种机械变形下的柔性电子设备的可靠性。所提出的测试装置可以容易地提供各种变形,这对于通知装置形状和结构的设计是有用的,以适应在使用期间的变形。

著录项

  • 作者

    Cheol Kim; Chung Kim;

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  • 年度 2018
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  • 原文格式 PDF
  • 正文语种 eng
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