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On the composite discontinuous Galerkin method for simulations of electric properties of semiconductor devices

机译:关于半导体器件电气性能模拟的复合不连续Galerkin方法

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摘要

In this paper two variants of discretization of the van Roosbroeck'sequations in equilibrium state with the Composite Discontinuous Galerkin Methodfor rectangular domain are discussed. They base on Weakly Over-PenalizedSymmertic Interior Penalty (WOPSIP) method and on Symmetric Interior PenaltyGalerkin (SIPG) method. It is shown that the discrete problems are well-defined and that theirsolutions are unique. Error estimates are derived. Finally numericalsimulations of gallium nitride semiconductor devices are presented.
机译:在本文中,讨论了与矩形域的综合域的平衡状态的van roosbroeck'van Roosbroeck'sequation的两个变体。它们基于弱惩罚的作用内部惩罚(WOPSIP)方法和对称内部惩罚方法(SIPG)方法。结果表明,离散问题是明确定义的,并且它们的溶解是独一无二的。错误估计是终止的。最后提出了氮化镓半导体器件的数值倍。

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