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Monolayer Semiconductors: Scanning Probe Lithography Patterning of Monolayer Semiconductors and Application in Quantifying Edge Recombination (Adv. Mater. 48/2019)

机译：单层半导体：扫描探头标准图案单层半导体和定量边缘复合的应用（ADV。Mater。48/2019）

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Peida Zhao; Ruixuan Wang; Der‐Hsien Lien; Yingbo Zhao; Hyungjin Kim; Joy Cho; Geun Ho Ahn; Ali Javey;
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1. Scanning Probe Lithography Patterning of Monolayer Semiconductors and Application in Quantifying Edge Recombination [J] . Zhao Peida, Wang Ruixuan, Lien Der-Hsien, Advanced Materials . 2019,第48期

机译：单层半导体扫描探针光刻图形化及其在边缘重组中的应用
2. Metal Oxide Semiconductors: Direct Photopatterning of Solution–Processed Amorphous Indium Zinc Oxide and Zinc Tin Oxide Semiconductors—A Chimie Douce Molecular Precursor Approach to Thin Film Electronic Oxides (Adv. Mater. Interfaces 15/2018) [J] . Sanctis Shawn, Hoffmann Rudolf C., Bruns Michael, Advanced materials interfaces . 2018,第15期

机译：金属氧化物半导体：直接照射溶液加工的无定形铟锌氧化锌和氧化锡半导体 - 一种薄膜茶片电子氧化物的分子前体方法（ADV。母体。接口15/2018）
3. Measuring the Edge Recombination Velocity of Monolayer Semiconductors [J] . Zhao Peida, Amani Matin, Lien Der-Hsien, Nano letters . 2017,第9期

机译：测量单层半导体的边缘复合速度
4. Measuring the edge recombination velocity of monolayer semiconductors [C] . Peida Zhao, Matin Amani, Der-Hsien Lien, Berkeley Symposium on Energy Efficient Electronic Systems and Steep Transistors Workshop . 2017

机译：测量单层半导体的边缘复合速度
5. Scanning tunneling microscopy studies of growth medium & temperature dependent structural phases of alkanethiol self-assembled monolayers, reactive self-assembled monolayers, & flat gold nanoparticle/indium tin oxide substrates and a scanning surface photovoltage microscopy study for local mechanical stress characterization in complementary metal oxide semiconductor devices. [D] . Dahanayaka, Dahanayaka Liyanage Daminda Hemal. 2010

机译：烷烃硫醇自组装单分子层，反应性自组装单分子层，扁平金纳米颗粒/铟锡氧化物基质的生长介质和温度依赖性结构相的扫描隧道显微镜研究，以及互补金属氧化物中局部机械应力表征的扫描表面光电压显微镜研究半导体器件。
6. Patterned arrays of lateral heterojunctions within monolayer two-dimensional semiconductors [O] . Masoud Mahjouri-Samani, Ming-Wei Lin, Kai Wang, -1

机译：单层二维半导体中横向异质结的图案化阵列
7. Scanning Probe Lithography Patterning of Monolayer Semiconductors and Application in Quantifying Edge Recombination [O] . Peida Zhao, Ruixuan Wang, Der‐Hsien Lien, 2019

机译：单层半导体的扫描探头标图案和在量化边缘复合的应用中的应用
8. Scanning Probe Lithography. 4. Effect of Scanning Tunneling Microscope TipParameters on Lithographic Patterns in Self-Assembling Monolayers [R] . Schoer, J. K., Crooks, R. M. 1996

机译：扫描探针光刻。扫描隧道显微镜Tipparameters对自组装单层光刻图案的影响

Monolayer Semiconductors: Scanning Probe Lithography Patterning of Monolayer Semiconductors and Application in Quantifying Edge Recombination (Adv. Mater. 48/2019)

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