Accuracy in Powder Diffraction II. Proceedings of the International Conference.Held in Gaithersburg, Maryland on May 26-29, 1992

摘要

The proceedings of the international conference Accuracy in Powder Diffraction IIpresent the invited papers and abstracts of the papers contributed to the conference, which was held at NIST, Gaithersburg, Maryland, during May 26-29, 1992. The conference was organized by the Commission on Powder Diffraction of the International Union of Crystallography, and was jointly sponsored by NIST, JCPDS--International Centre for Diffraction Data and the International Union of Crystallography. The proceedings contain 25 invited papers and 73 contributed abstracts. The program of the conference was divided into six topics: Phase Identification and Quantification; Accuracy and Standards; New Developments in Software and Data Analysis; Profile Fitting, Decomposition and Microstructural Effects; Novel Applications and Structural Science; and New Developments in Hardware, Including Detectors, and Studies under Non-ambient and Time-resolved Conditions. A ceremonial session was devoted to a tribute to the late William Parrish and his contributions to powder diffraction. In addition, there were two tutorial workshops organized by the JCPDS--International Centre for Diffraction Data, one on diffractometer sensitivity and one on automatic indexing methods.