In the Matter of: Certain Probe Card Assemblies, Components Thereof and Certain Tested DRAM and NAND Flash Memory Devices and Products Containing Same. Investigation No. 337-TA-621

摘要

This investigation was instituted on December 19, 2007, based on a complaint filed by FormFactor, Inc. (FormFactor) of Livermore, California. The complaint alleged violations of section 337 of the Tariff Act of 1930 (19 U.S.C. 1337) in the importation into the United States, the sale for importation, and the sale within the United States after importation of certain probe card assemblies, components thereof, and certain tested DRAM and NAND flash memory devices and products containing same by reason of infringement of certain claims of U.S. Patent Nos. 5,994,152; 6,509,751 (the 751 patent); 6,615,485; 6,624,648 (the 648patent); 7,168,162 (the 162 patent); and 7,225,538. The complaint named Micronics Japan Co., Ltd.; MJC Electronics Corp.; Phicom Corporation; and Phiam Corporation as respondents (collectively, Respondents). Subsequently, the 162 patent was terminated from the investigation.