Coordinated Development of Standards for Surface Chemical Analysis

摘要

This report is based on a proposal to the Steering Committee of the Versailles Project on Advanced Materials and Standards (VAMAS) for the coordinated development amongst the VAMAS member states of standards for surface chemical analysis. VAMAS was established following a meeting of the Heads of State or government at Versailles, France in 1982 that agreed on a number of projects relating to technology, growth, and employment. Specifically, VAMAS was organized to promote international coordination in the development of standards in a wide range of advanced material sectors. Surface chemical analysis was approved as a VAMAS Technical Working Area in June, 1984. The report describes the growth and diversity of surface analysis in the development of advanced materials in modern technologies and additionally, the use of surface analysis for improved films and coatings. The principal techniques of surface analysis in common use are identified and the technical limitations to accurate surface analyses identified. Specific needs are identified for the common methods of surface analysis, Auger-electron spectroscopy, x-ray photoelectron spectroscopy, and secondary-ion mass spectroscopy together with the needs for ion sputtering which is used to obtain composition versus depth information in films and coatings. Existing standards activities in the member countries of VAMAS are reviewed and suggestions are made for additional standards for surface chemical analysis.