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JTECH (Japanese Technology Evaluation Program) Panel Report on Computer Integrated Manufacturing (CIM) and Computer Assisted Design (CAD) for the Semiconductor Industry in Japan

机译:JTECH(日本技术评估计划)日本半导体产业计算机集成制造(CIm)和计算机辅助设计(CaD)专题小组报告

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摘要

Computer integrated manufacturing (CIM) and computer aided design (CAD) are two technical areas which have been key to the dramatic growth of the integrated circuit market. The report examines the U.S. competitive position in these technologies through a study of the quality and direction of Japanese R&D in CIM and CAD, and compares the results to the R&D of the technology in the United States. With respect to CIM, the report discusses current practice in Japan, system architecture, implementation of factory functions, the role of modeling and simulation, the role of knowledge-based systems, the management of change. The section on CAD provides an introduction to CAD and then considers logic synthesis efforts, Japanese efforts in register-transfer level synthesis, fundamental research in physical design, software design tools, design platforms, hardware design engines, simulation, new design technologies and methodologies, design verification, and test verification.

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