An Ellipsometer with Variable Angle of Incidence for Studies in Ultrahigh Vacuum

摘要

The windows for the vacuum chamber are incorporated into the optical bench system by means of flexible bellows which allow measurements to be made over a large range of angle of incidence, one of which is chosen so that maximum sensitivity is obtained. The principal angle of incidence was determined, and straightforward corrections for strain birefringence of vacuum chamber windows were made. Atomically clean surfaces of sodium chloride and lithium fluoride were investigated to verify the performance of the system. Submonolayer and monolayer coverage of water on these surfaces could be detected. On cleavage planes of NaCl, a first monolayer of adsorbed water is complete at about one torr only. (Author)