Microwave microstrip resonator measurements of Y1Ba2Cu3O(7-x) and Bi2Sr2Ca1Cu2O(8-y) thin films

摘要

Radio frequency (RF) surface resistance measurement experiments on high T(sub c) thin films were performed. The method uses a microstrip resonator comprising a top gold conductor strip, an alumina dielectric layer, and a separate superconductivity ground plane. The surface resistance of the superconducting ground plane can be determined, with reference to a gold calibration standard, from the measured quality factor of the half-wave resonator. Initial results near 7 GHz over the temperature range from 25 to 300 K are presented for YBa2Cu3O(7-x) and Bi2Sr2CaCu2O(8-y) thin film samples deposited by an electron beam flash evaporation process. The RF surface resistance at 25 K for both materials in these samples was found to be near 25 milliohms.