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Alignment of the metrology and the starlight beams of the MAM testbed in order to enable the micro-arcsecond level performance needed by SIM

机译：mam测试台的计量和星光束的对准，以实现sIm所需的微弧级第二级性能

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Goullioud, R.; Bloemhof, E.;
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年度 2002
页码 1-1
总页数 1
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
ALIGNMENT; INTERFEROMETRY; METROLOGY; SIM; interferometry SIM metrology alignment;

机译：对准;干涉; mETROLOGY; sIm卡;干涉测量sIm计量校准;

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Alignment of the metrology and the starlight beams of the MAM testbed in order to enable the micro-arcsecond level performance needed by SIM

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