Refracted x-ray fluorescence (RXF) applied to the study of thermally grown oxide scales on Fe-Cr-Ni-(RE) alloys.

摘要

Refracted X-Ray Fluorescence (RXF) is applied to the study of the thermally grown scales on Fe25Cr20Ni(RE) alloys. The evolution of chromia scales is investigated for alloys containing reactive elements (RE) Y and Zr as well as the corresponding RE-free alloy. For these alloys, scale compositions, scale thicknesses and growth rates are measured and information about concentration depth profiles is obtained.