Wavelength Dispersing Devices for Soft and Ultrasoft X-Ray Spectrometers

摘要

Monochromatization combining total reflection by a selected mirror and an appropriate filter offered an alternative approach in order to increase measurable intensity with reasonable spectral resolution. Recently, the use of synthetic multilayers, which are prepared by sputter/evaporation techniques, has been introduced for the detection of soft and ultrasoft x-rays. Studies on the use of these new wavelength dispersing devices have been conducted and it has been found that the reflectivity of these devices is very high compared with single crystals and soap multilayers and that their resolving power is fairly good. This report makes comparisons regarding efficiency of reflection, resolving power and x-ray analytical problems for practical applications among long spacing single crystals, soap multilayers, total reflection combined with a selected mirror and filtering and synthetic multilayers. The x-ray analytical capablities are shown based upon a standard x-ray fluorescence spectrometer equipped with a sealed-off x-ray tube and a gas flow proportional counter with thin film detector window.