Applying Parallel Data Processing to Automated Test Equipment

摘要

Parallel processing techniques make possible simultaneous acquisitions of product test data through the use of multiple microprocessors. Dedicating one processor with its own memory, analog to digital converter, programmable level detectors, and event timer to each product test point provides flexibility and avoids contentions for measurement resources. Significant increases in speed and reliability over single-processor testers have been achieved. (ERA citation 11:005935)