WOCSDICE 97: 21st Workshop on Compound Semiconductor Devices and IntegratedCircuits Held on May 25-28 1997 in Scheveningen, The Netherlands

摘要

Partial contents: Reliability and degradation of HEMTs and HBTs; High TemperatureOperation of GaAs Based HFET Structure Containing Layers Grown at Low Temperature; Application of Semiconductor Interface Modeling to Reliability Characterization; Metal probe technique for characterisation of semiconductor materials used in optoelectronic devices; A Novel Approach for Determining the Reliability of AlGaAs/GaAs HBTs from Low-Frequency Noise Characteristics; Optoelectronics; Photonic Integrated Circuits for multiwavelength applications; Polarization independent InGaAs/InP chopped quantum well interferometric space switch at 1.55 pm; Design and analysis of a 1 x 8 wavelength division multiplexer based on the self-imaging theory; Design and analysis of a 1 x 32 tapered coupler based on the self-imaging theory.