Elastic Scattering of Light from Fluctuating Exciton Polarization of a Quantum Well in a Semiconductor Microcavity.

摘要

A model of exciton polarization fluctuations due to randomly rough interfaces of a quantum well (QW) is proposed. On this basis, a theory of the resonant elastic scattering of light is developed for a random-thickness QW placed in a semiconductor microcavity. Numerical study of the cross-section shows that the light scattering induced by roughness with standard deviation height as small as 0.2 nm could be detected experimentally. An enhancement of backscattering intensity is predicted.