An experimental tube and associated circuitry have been developed to measure the point-by-point variation (or "patchiness") in the work function of conductive surfaces. The technique involves scanning the surface with a small-diameter, low-energy electron beam in a televisionlike fashion. An enlarged image showing the pattern of the work-function variation on the surface is obtained on akinescope tube. The associated circuitry also provides a method of obtaining, during one scan, the values of the work functions of many small regions of the scanned surface. These individual values are automatically catalogued and stored by means of a 400-channel analyzer which gives a plot of the area distribution in work function in about three seconds.
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