A Method of Fourier Analysis of X-Ray Peak Shapes Using Only First-Order Peaks

摘要

A method of Fourier analysis of x-ray line broadening is presented whereby microstrains, incoherent particle sizes, and stacking fault probabilities can be calculated using only first order peaks. This approach also eliminates errors due to peak truncation and provides a method for accurate determinations of integrated intensities. Calculations based on this method are compared to results obtained using the usual method of multiple orders. (Author)