Laser Damage in Dielectric Coatings--Identification of Inclusions as the Limiting Damage Mechanism and First Observation of Intrinsic Damage in Dielectric Coatings.

摘要

Inclusion damage due to metallic or highly absorbing inclusions has been conclusively identified as the practical limitation in the threshold for laser-induced dielectric film damage at the wavelength 0.69micrometer. The predicted 'pulse duration-inclusion size'relationship has been observed. It has been shown that linear absorption is not a limiting damage mechanism when films are properly prepared from materials which do not shown bulk absorption. The first verified observation of intrinsic damage in dielectric films is discussed. (Author)