The Structure of Non-Crystalline Materials. Determination of Local Structure in Amorphous GeSe, GeSe2, As2 Se3, As2S3,and As2Te3Using EXAFS.

摘要

Previously,it was shown that Fourier transforms of the extended x-ray absorption fine structure (EXAFS) contains information on the coordination distances and numbers about each constituent in multicomponent amorphous semiconductors. In this paper a method of analysis of the experimentally observed first coordination peak is presented which calculates the absolute number of each kind of atom which contributes to that peak. (Modified author abstract)