Electron Charging and SGEMP (System Generated Electromagnetic Pulse) Studies on Satellite Dielectrics

摘要

An experiment was conducted to measure the electrical response of satellite thermal control dielectrics when exposed to mono-energetic electron beams from 5-30 keV. Responses included SGEMP pulses when exposed to short (less than 100 ns) pulses of low energy X-rays (less than 2 keV), and spontaneous discharges. Significant SGEMP enhancement was noted as a result of precharging, and is explained by a theory which includes low-energy secondary electrons which escape via lateral edge fields. Potential profiles were taken across the sample surface during charging and after discharges. Transient measurements included charge flowing from the substrate, charge ''blown off'' the test object, and between different portions of the substrate. Two anomalous events are reported which showed ''blow-off'' lasting up to a microsecond after photon exposure, accompanied by a late time substrate current.