Measurement of Precision Oscillator Phase Noise Using the Two- Oscillator Coherent Down-Conversion Technique

摘要

This paper addresses the characterization of precision frequency standard phase noise and spurious outputs wing the two-oscillator coherent down- conversion technique. This paper focuses on techniques for making inadequate measurements of phase noise and spurious outputs within 100 KHz of a carrier. Significant sources of measurement error related to hardware design problems and inadequate measurement procedures are discussed, such as: measurement errors resulting from system noise sources, phase-locked loop effects, and system bandwidth limitations. In addition, methods and design considerations for minimizing the effects of such errors are presented. Analytic discussions and results are supplemented with actual test data and measurements made using measurement hardware developed at Ball Corporation, Efratom Division.