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The reference lattice concept and its application to the analysis of diffraction patterns

机译:参考晶格概念及其在衍射图样分析中的应用

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The concept of the reference lattice has been thoroughly discussed in physical and in higher-dimensional spaces. Such an approach has been applied to diffraction pattern analysis of different periodic, modulated and other aperiodic structures. It has been shown that two periodicities can be found in diffraction patterns of the above structures, namely the periodicity of the envelope curves describing the diffraction peak intensities, and the periodicity of peak positions ascribed to each envelope curve. The formula for the envelope curve has been given and it depends on the statistical moments of a specially defined real-space variable describing spatial fluctuations in atomic positions. Full equivalence of the presented physical space approach to the higher-dimension analysis of perfect quasicrystals has been shown. [References: 21]
机译:参考格子的概念已在物理空间和高维空间中进行了全面讨论。这种方法已经应用于不同周期性,调制和其他非周期性结构的衍射图分析。已经表明,在上述结构的衍射图中可以发现两个周期性,即描述衍射峰强度的包络线的周期性和归因于每个包络线的峰位置的周期性。已经给出了包络线的公式,它取决于专门定义的描述原子位置空间波动的实空间变量的统计矩。已经证明,所提出的物理空间方法与完美准晶体的高维分析完全等效。 [参考:21]

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