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Control of the oxygen doping in Bi-2212 whiskers by means of their synthesis process

机译:通过Bi-2212晶须的合成过程控制氧掺杂

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摘要

Direct evidence of oxygen doping control in single phase Bi2Sr2CaCu208+δ (Bi-2212)whiskers is reported, along with the changes in their structural properties obtained by varyingthe growth temperature of the synthesis process in the range from 843 to 872 °C. The as-grownwhiskers were investigated by means of x-ray powder diffraction (XRPD), electrical transportmeasurements, scanning electron microscopy (SEM) and energy dispersive x-ray spectroscopy(EDS). The XRPD measurements showed that the value of the c-axis lattice parameter increasesfrom 30.556 to 30.640 A when increasing the growth temperature, which indicates differentoxygen doping levels spanning from the slightly overdoped to the nearly optimally dopedregimes. Such results are also confirmed by the electrical characterizations, which revealed atypical relationship among resistivity (ρab), superconducting critical temperature (Tc),andc-axis value. The growth of CuO crystals has also been identified during this study, with amaximum yield in the range 860-864 °C, where also a slope change in the c-axis behavior hasbeen found, implying a possible correlation between the two phenomena. Therefore, bychanging the synthesis growth temperature, one can provide an effective way to tune thewhisker electrical transport properties.
机译:据报道,单相Bi2Sr2CaCu208 +δ(Bi-2212)晶须中氧掺杂控制的直接证据,以及通过在843至872°C范围内改变合成过程的生长温度而获得的结构特性的变化。通过X射线粉末衍射(XRPD),电迁移测量,扫描电子显微镜(SEM)和能量色散X射线光谱法(EDS)研究了晶须。 XRPD测量表明,当增加生长温度时,c轴晶格参数的值从30.556 A增加到30.640 A,这表明不同的氧掺杂水平涵盖了从轻度掺杂到几乎最佳掺杂的范围。这些结果也被电学特性所证实,它揭示了电阻率(ρab),超导临界温度(Tc)和c轴值之间的非典型关系。在这项研究中,还确定了CuO晶体的生长,其最大产率在860-864°C范围内,在该处还发现了c轴行为的斜率变化,这暗示了这两种现象之间可能存在的相关性。因此,通过改变合成生长温度,可以提供一种有效的方法来调节晶须的电传输性能。

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