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首页> 外文期刊>Spectrochimica Acta, Part B. Atomic Spectroscopy >Cobalt thin films on gold:A new reference material for the quantification of cobalt phthalocyanine and cobalt porphyrin modified gold electrodes with synchrotron radiation micro X-ray fluorescence spectroscopy
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Cobalt thin films on gold:A new reference material for the quantification of cobalt phthalocyanine and cobalt porphyrin modified gold electrodes with synchrotron radiation micro X-ray fluorescence spectroscopy

机译:金上的钴薄膜:利用同步辐射微X射线荧光光谱法定量测定酞菁钴和卟啉钴修饰的金电极的新参考材料

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摘要

New reference materials consisting of cobalt thin films on gold were prepared by sputter deposition.The thickness and homogeneity of the films were characterized using synchrotron radiation micro-XRF.The samples can be used as reference materials to quantify cobalt phthalocyanine and cobalt porphyrin modified gold electrodes which have been analyzed with synchrotron radiation micro-XRF.
机译:通过溅射沉积制备了新的由钴薄膜在金上组成的参比材料,利用同步辐射微XRF对薄膜的厚度和均匀性进行了表征,这些样品可作为定量钴酞菁和卟啉钴修饰金电极的参考材料已经用同步辐射微型XRF进行了分析。

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