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首页> 外文期刊>Semiconductors >The U Peak in the DLTS Spectra of n-GaAs Irradiated with Fast Neutrons and 65-MeV Protons
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The U Peak in the DLTS Spectra of n-GaAs Irradiated with Fast Neutrons and 65-MeV Protons

机译:快速中子和65 MeV质子辐照的n-GaAs DLTS光谱中的U峰

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摘要

The origin of a broad U band in spectra obtained using deep-level transient spectroscopy (DLTS) on n-GaAs irradiated with fast neutrons and 65-MeV protons was investigated. It is believed that this band is presumably a superposition of two peaks related to two defects P2 and P3 which have been well documented in GaAs and reside within defect clusters. THe DLTS spectra were calculated taking into account the nonuniform distribution of these defects in a sample and the built-in electric fields induced by corresponding inhomogeneities.
机译:研究了使用快速中子和65 MeV质子辐照的n-GaAs上的深层瞬态光谱法(DLTS)获得的宽谱带的起源。据信,该带可能是与两个缺陷P2和P3有关的两个峰的叠加,这两个峰已在GaAs中得到了很好的证明,并存在于缺陷簇中。考虑到这些缺陷在样品中的不均匀分布以及由相应的不均匀性引起的内建电场,计算了DLTS光谱。

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