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Controlled deterioration and accelerated ageing tests to predict seedling emergence of watermelon under stressful conditions and seed longevity

机译:通过控制变质和加速老化试验来预测西瓜在压力和种子寿命下的出苗率

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The emergence of 19 commercial seed lots (10 in 2005 and 9 in 2006) of watermelon (Citrullus la.na.tus Matsum and Nakai, Thunb.) with laboratory germination >90% were compared in stressful conditions of low temperature (LTE, early spring), mechanicalstress (MSB, 6 cm deep sowing) and salt stress (SSE, 200 mM NaCl). The emergence percentage ranged between 12 - 54% for LTE, 19 -75%, for MSB and 43 - 91% in 2005 and 35 - 80% at LTE, 13 - 82% at MSE, 45 - 92% at SSE in 2006. The radicle emergence of thelots was determined after controlled deterioration (CD) at 40 and 45 deg C in 2005, or at 45 and 47 deg C in 2006, with 20% or 24% moisture content for 48, 72, 96, 120, 144 hours in 2005 and 48, 72, 96, 120, 144, 168 hours in 2006. The accelerated ageing test was also conducted at the same temperatures and ageing durations in both years. The germination range of the seed lots increased in both CD and AA as the ageing period was extended. Germination after all combinations of CD was positively and significantly (p<0.05) correlated with LTE, MSE and SSE. However, most very highly significant correlations (p<0.001) were observed after CD for between 48-96 hours at 45 deg C and at 24% in both years. Germination after the AA test was correlated with LTE, MSE and SSE. This was especially seen at 40 and 45 deg C. The highest number of very highly correlated combinations was found after AA at 47 deg C for 120 or 144 hours. The initial laboratory germination was significantly related to LTE, MSE and SSE, butthe correlation values were much lower than those of both ageing tests. Laboratory germination after 6 month storage at 25 deg C and 12% seed me was closely correlated with germination after both AA and CD tests (p<0.001). The results show that both ageing tests can be used to predict seedling emergence under stressful conditions. The optimum CD conditions of 48 hours and 24% me at 45 deg C and AA conditions of 120-144 hours at 45 deg C are suggested as a routine predictive test of watermelon seed emergence and longevity.
机译:在低温胁迫条件下(LTE,早期),比较了实验室发芽> 90%的19个商业种子批次(2005年为10个,2005年为9个,2006年为9个)的实验室发芽率。春季),机械应力(MSB,6厘米深播种)和盐胁迫(SSE,200 mM NaCl)。 LTE的出现百分比介于2005年的LTE的12-54%,MSB的19 -75%和43%-91%,LTE的35-80%,MSE的13-82%,SSE的45- 92%。在2005年40和45摄氏度或2006年45和47摄氏度的受控变质(CD)后,测定了萝卜的胚根出现,水分含量为48,72,96,120,144的20%或24%在2005年的48小时,2006年的48、72、96、120、144、168小时。在这两年中,加速老化测试也在相同的温度和老化时间下进行。随着老化时间的延长,CD和AA中种子批次的发芽范围均增加。所有CD组合后的发芽与LTE,MSE和SSE呈正相关(p <0.05)。然而,在CD中,在45摄氏度和48%的两个小时之间观察到的最高相关性最高(p <0.001),在两年中均为24%。 AA测试后的发芽与LTE,MSE和SSE相关。在40和45摄氏度时尤其如此。在47摄氏度AA下120或144小时后,发现了数量最高的高度相关的组合。实验室的初始萌发与LTE,MSE和SSE显着相关,但相关值远低于两个老化测试的相关值。在25摄氏度和12%种子中保存6个月后,实验室发芽与AA和CD测试后的发芽密切相关(p <0.001)。结果表明,两种老化试验都可用于预测胁迫条件下的幼苗出苗。作为西瓜种子出苗和长寿的常规预测测试,建议在45摄氏度下48小时和24%me的最佳CD条件和在45摄氏度下120-144小时的AA条件。

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