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首页> 外文期刊>Modern Physics Letters, B. Condensed Matter Physics, Statistical Physics, Applied Physics >The performance study of OLED based on Cs2O doped Ag2O thin layer structure as the electronic injection layer
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The performance study of OLED based on Cs2O doped Ag2O thin layer structure as the electronic injection layer

机译:基于Cs2O掺杂Ag2O薄层结构作为电子注入层的OLED性能研究。

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摘要

The effect on the properties of organic electroluminescent devices was studied using various electronic injection layers. As a result, the electron injection layer by Cs2O doped Ag2O, when the mass fraction was 17% and the thickness was 1 nm, the performance of the device was significantly higher than the single Cs2O and LiF as electronic injection layer. The maximum power efficiency reached 0.91 lm/W, which was higher than that of Cs2O 0.64 lm/W and LiF 0.32 cd/A raised 1.42 times and 2.84 times, respectively. In addition, the light voltage of the doping device was 8 V, and that of the Cs2O and LiF device was 9 V. So the turn- on voltage was reduced.
机译:使用各种电子注入层研究了对有机电致发光器件性能的影响。结果,通过Cs 2 O掺杂的Ag 2 O的电子注入层,当质量分数为17%并且厚度为1nm时,器件的性能显着高于作为电子注入层的单个Cs 2 O和LiF。最大功率效率达到0.91 lm / W,高于Cs2O 0.64 lm / W和LiF 0.32 cd / A分别提高1.42倍和2.84倍。此外,掺杂设备的光电压为8 V,而Cs2O和LiF器件的光电压为9V。因此降低了导通电压。

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