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首页> 外文期刊>Materials science in semiconductor processing >Influence of Sb doping on the structural, optical and electrical properties of p-ZnO thin films prepared on n-GaN/Al2O3 substrates by a simple CVD method
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Influence of Sb doping on the structural, optical and electrical properties of p-ZnO thin films prepared on n-GaN/Al2O3 substrates by a simple CVD method

机译:Sb掺杂对通过简单CVD方法在n-GaN / Al2O3衬底上制备的p-ZnO薄膜的结构,光学和电学性质的影响

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摘要

ZnO thin films with different Sb doping concentrations were prepared on n-GaN/Al2O3 substrates by simple chemical vapor deposition. Field emission scanning electron microscopy (FE-SEM) showed that the morphologies of ZnO thin films were rougher and the size of the crystal grains reduced with increasing Sb concentration. The X-ray diffraction measurements indicated that the (002) diffraction peak positions of samples shifted gradually towards the lower angle side, which explained the substitution of Sb3+ into the Zn site by Sb doping. In addition, Hall measurement results indicated that Sb doped ZnO thin films had p-type conductivity, and the optimal Sb2O3/ZnO mass ratio for p-type ZnO thin film was approximately 1:4. Optical absorption spectrum measurement indicated that the energy gaps of the samples were evidently narrowed with increasing Sb doping concentration. (C) 2014 Elsevier Ltd. All rights reserved.
机译:通过简单的化学气相沉积在n-GaN / Al2O3衬底上制备了不同Sb掺杂浓度的ZnO薄膜。场发射扫描电子显微镜(FE-SEM)表明,随着Sb浓度的增加,ZnO薄膜的形貌更加粗糙,晶粒尺寸减小。 X射线衍射测量表明,样品的(002)衍射峰位置逐渐移向下角侧,这解释了通过Sb掺杂将Sb3 +替换为Zn位点。另外,霍尔测量结果表明掺Sb的ZnO薄膜具有p型导电性,并且p型ZnO薄膜的最佳Sb2O3 / ZnO质量比约为1:4。光吸收光谱测量表明,随着Sb掺杂浓度的增加,样品的能隙明显缩小。 (C)2014 Elsevier Ltd.保留所有权利。

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