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首页> 外文期刊>Electrochimica Acta >On the dependence of the Nernst diffusion layer thickness on potential and sweep rate for reversible and of the thickness of the charge transfer layer for irreversible processes studied by application of the linear potential sweep method
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On the dependence of the Nernst diffusion layer thickness on potential and sweep rate for reversible and of the thickness of the charge transfer layer for irreversible processes studied by application of the linear potential sweep method

机译:通过使用线性电势扫描方法研究了能斯特的Nernst扩散层厚度对可逆电势和扫描速率的影响以及对不可逆过程的电荷转移层厚度的依赖关系

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摘要

In this paper, a discussion is made of the dependence between the diffusion layer thickness and the potential sweep rate and the potential value for reversible charge transfer processes studied under the application of a linear potential sweep. Also the equivalent circuit for that type of processes is remembered as well as the concept of conductance. The same concepts are discussed for the case of irreversible charge transfer processes studied also by linear potential sweep voltammetry. A consideration is made of the concept of general conductance as utilised in electrochemical processes and the results of its utilisation are compared with those obtained by using the physical definition of conductance and discussed.
机译:在本文中,讨论了在线性电势扫描的情况下研究的可逆电荷转移过程中扩散层厚度与电势扫描速率和电势值之间的关系。还应记住此类过程的等效电路以及电导的概念。对于不可逆电荷转移过程的情况,也讨论了相同的概念,该过程也通过线性电位扫描伏安法研究。考虑了电化学过程中使用的一般电导率的概念,并将其使用结果与通过电导率的物理定义获得的结果进行了比较并进行了讨论。

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