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首页> 外文期刊>International Journal of Fracture >Creep crack propagation in gold submicron films at room temperature
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Creep crack propagation in gold submicron films at room temperature

机译:室温下金亚微米膜的蠕变裂纹扩展

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摘要

We conducted creep crack propagation experiments on Au freestanding films of 400 nm thickness at room temperature to determine the dominant fracture mechanics parameter. In the experiments, a crack stably propagated accompanied by creep deformation, and it was found that the crack propagation rate was neither uniquely characterized by the stress intensity factor nor the net stress. Furthermore, the steady-state creep J-integral was estimated by an approximate equation using the experimental crack center opening displacement, and the relations were observed within a narrow band irrespective of the specimen width and applied stress. The results indicated that the creep J-integral is the dominant mechanical parameter that characterizes the creep crack propagation rate in Au films.
机译:我们在室温下对400 nm厚的Au自立膜进行了蠕变裂纹扩展实验,以确定主要的断裂力学参数。在实验中,裂纹伴随蠕变变形而稳定地扩展,发现裂纹扩展速率既不是由应力强度因子来表征的,也不是由净应力来表征的。此外,使用实验裂纹中心开口位移通过近似方程式估算稳态蠕变J积分,并且不管样品宽度和施加应力如何,都在窄带内观察到这种关系。结果表明,蠕变J积分是表征金膜中蠕变裂纹扩展速率的主要力学参数。

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