AbstractA yield‐based assessment procedure for breeding for resistance toSeptoria nodorum(SN) is presented. Artificially infected as well as fungicide‐protected plots were analyzed for each genotype. Considerable increase in precision of disease scores was gained by using an assessment matrix for different plant organs and time intervals during disease development. This technique resulted in yield loss: disease attack correlations up to r = 0.85:** and raised coefficients of heritability (h2b= broad sense heritability) with h2b= 0.72 for yield loss and h2b= 0.86 for SN‐attack, calculated for a 3‐year replicated field experiment with 105 winter wheat cu
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