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Magnetic dissipation force microscopy

机译:Magnetic dissipation force microscopy

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摘要

A method of measuring magnetic dissipation on a sub-100 nm scale is presented. This technique relies on measuring changes in the damping of the oscillating tip in a magnetic force microscope (MFM). Damping contrast is strongly correlated with micromagnetic structure and in the case of NiFe, is in quantitative agreement with magnetoelastic losses in the sample. On recording tracks, large damping signals are observed. This has direct consequences on the interpretation of traditional MFM images acquired with detectors that convolute frequency and damping information. #1997 American Institute of Physics. S0003-6951 (97)01428-9

著录项

  • 来源
    《Applied physics letters》 |1997年第4期|279-281|共3页
  • 作者

    P. Grütter; Y. Liu; P. LeBlanc;

  • 作者单位

    Department of Physics, Centre for the Physics of Materials, McGill University,/ Montréal H3A 2T8, Canada;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 应用物理学;
  • 关键词

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