Transport properties in Tlhyphen;Bahyphen;Cahyphen;Cuhyphen;O grain boundary junctions on SrTiO3bicrystal substrates

摘要

We have investigated the electrical properties of Tlhyphen;Bahyphen;Cahyphen;Cuhyphen;O highhyphen;Tcsuperconductor bicrystal grain boundary junctions. The behavior of the transport parameters is very similar to those obtained in YBaCuO7minus;dgr;junctions. In particular, the temperature dependence of the critical current and the scaling behavior of the critical current density as a function of the misorientation angle were analyzed. Relatively good control of the transport parameters as a function of the misorientation angle has been achieved. The currenthyphen;voltage characteristics showed a resistively shunted junction modelhyphen;like behavior at large angles (thgr;ge;20deg;); at lower angles, the characteristics were more fluxhyphen;flow like. Preliminary results on noise characteristics are also presented.