机译:New Low-Voltage Low-Latency Mixed-Voltage I/O Buffer
School of Information and Communication Engineering, Sungkyunkwan University, Suwon, 440-746, Korea Samsung Electronics, Hwasung, 445-701, Korea;
School of Information and Communication Engineering, Sungkyunkwan University, Suwon, 440-746, Korea;
Samsung Electronics, Hwasung, 445-701, Korea;
mixed-voltage; I/O buffer; gate-oxide reliability; leakage current; hot-carrier degradation;