机译:A New First-Scan Method for Two-Scan Labeling Algorithms
College of Electrical & Information En-gineering, Shaanxi University of Science and Technology, Shaanxi 710021, China and the Graduate School of Information Science and Technology, Aichi Prefectural University, Nagakute-shi, 480-1198 Japan;
Graduate School of Environment Man-agement, Nagoya Sangyo University, Owariasahi-shi, 488-8711 Japan;
Department of Radiology, Division of the BiologicalSciences, The University of Chicago, Chicago, IL 60637, USA;
labeling algorithm; connected component; first scan; pattern recognition;