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A Yield Surface Linearization Procedure in Limit Analysis*

机译:A Yield Surface Linearization Procedure in Limit Analysis*

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摘要

Within the framework of discretized structural models and piecewise linear yield polyhedra, a heuristic is presented to iteratively improve the limit load estimation by approaching locally the plastic admissibility domain. For the two-dimensional active stress situation, the scheme requires the generation of at the most three vertices, in addition to the initial four, to describe the improved inscribed yield polygon. Two examples are given to illustrate the procedure and to clarify various aspects of the algorithm presented.

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